Silicon wafers are the base materials for integrated circuits, the building blocks of microelectronics used in many computers, cell phones and other devices. And while used for a variety of common items, making and measuring silicon wafers is a complicated and exacting process. In the production of silicon wafers, manufacturers are particularly concerned with bow, warp and overall flatness of the substrates.
Engineers use a precision scanning confocal displacement sensor to inspect the surface of a steel brake line tip for scratches and defects. They use a new white-light distance sensor from Acuity. The measurement pen aims down to the sample that is moved on a linear XY stage. The scanning station includes a turret of several confocal measurement pens, but users can order single-channel systems.