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| AR200 laser measurement sensors in wafer fabrication | ||||||||
| Acuity triangulation devices measure to silicon wafers | ||||||||
| Home > Products > AR200 > Common Applications > Semiconductorl | ||||||||
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Acuity's novel sensor design is well suited to measuring to high-reflective silicon wafers. In most cases, there is enough diffuse reflectivity to measure off the polished surface at random angles. AR200 laser measurement sensors are widely used by U.S. and international fabrication equipment designers to monitor and control the location of silicon wafers throughout the fabrication process. The AR200 has a robust design and hold up to chemically-intrusive environments in the semiconductor fabriacaiton setting. Please contact Acuity for more information. |
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Common applications for AR200 laser measurement sensors |
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